| from | 27-10-202113:00 |
| until | 27-10-202114:00 |
| duration | 1 hour |
| place | Fraunhofer IIS/EAS |
| city | Dresden, Deutschland |
| name | Ms. Dr. Katja Lohmann-SchwitaleFraunhofer IIS/EAS |
| phone | +49 351 4640 726 |
| katja.lohmann-schwitale@eas.iis.fraunhofer.de |
Our webinar on IC reliability provides an overview on measurements and simulations to ensure the reliability of ICs, especially for long-term applications. In particular, we highlight the flow from technology qualification based on wafer level reliability measurements to degradation models that can be used in aging simulations to virtually investigate the reliability of a design before entering manufacturing.