| von | 24.05.202315:00 |
| bis | 24.05.202316:00 |
| Dauer | 1 Stunde |
| Name | Fraunhofer IIS/EAS |
| Stadt | Dresden, Germany |
| Name | Frau Marie NoackFraunhofer IIS/EAS |
| Marie.Noack@eas.iis.fraunhofer.de |
The reliability of integrated circuits (ICs) and electronic systems is becoming increasingly important. This holds for many application scenarios, such as automotive, industrial, medical, communication, etc. Design for Reliability methods allow virtual investigations on the durability of electronics to support the development of reliable ICs and systems. This webinar focuses on solution approaches for IC designers.